MIPdatabase
Authors: Chyou JJ, Chu CS, Chien FC, Lin CY, Yeh TL, Hsu RC, Chen SJ
Article Title: Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis.
Publication date: 2006
Journal: Applied Optics
Volume: 45
Issue: (23)
Page numbers: 6038-6044.
Alternative URL: http://www.opticsinfobase.org/abstract.cfm?URI=ao-45-23-6038
Abstract: Surface plasmon resonance (SPR) sensing and an enhanced data analysis technique are used to obtain precise predictions of the dielectric constant and thickness of a nanolayer. In the proposed approach, a modified analytical method is used to obtain initial estimates of the dielectric constants and thicknesses of the metal film and a nanolayer on the sensing surface of a SPR sensor. A multiexperiment data analysis approach based on a two-solvent SPR method is then employed to improve the initial estimates by suppressing the noise in the measurement data. The proposed two-stage approach is employed to determine the dielectric constant and thickness of a molecular imprinting polymer nanolayer. It is found that the results are in good agreement with those obtained with an ellipsometer and a high-resolution scanning electron microscope. (C) 2006 Optical Society of America
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