Patent 1441

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Inventors: Jarrell JA, Tomany MJ, Dorschel CA
Patent Title: Enhanced resolution matrix-laser desorption and ionization TOF-MS sample surface
Publication date: 2002
Publication number: US6376044

Abstract: A thin layer for sample analysis by matrix-assisted laser desorption mass spectrometry, comprising a matrix material in a supported dispersion wherein the support is a solid or is formed from a solid. The invention is also directed to a method of making a thin layer for sample analysis by matrix-assisted laser desorption mass spectrometry, the layer comprising a matrix-solid composition disposed upon a substrate, comprising the step of depositing a solution containing matrix, solid and solvent upon a spinning substrate at a deposition rate sufficient to allow evaporation of the solvent, thereby interspersing the matrix and support on the substrate in a thin layer. Enhanced mass resolution is described.
URL: http://v3.espacenet.com/textdoc?DB=EPODOC&IDX=US6376044&F=0

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