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This index last updated: 13/12/2021

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Applied Optics

2006
ChyouJ.J.ChuC.S.ChienF.C.LinC.Y.YehT.L.HsuR.C.ChenS.J.
Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis
Applied Optics 45 (23), 6038-6044.

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